Securing precision and reproducibility from getting the electrical specifications of semiconductor device.
Minimizing an allowable error with setting the 6stage of current ranges to constant input current (1nA ~ 20mA) and also minimizing of electrical noise by using Van der Pauw technique method.
Compact desktop design and easy to use.
Easy to use by small-sized magnetic flux density input system using permanent magnet and low temperature measurement system.(77K) And, it is possible to test various size sample 5mm x 5mm ~ 30mm x 30mm, and max thickness sample is 5.5mm.
Plotting graph of I-V Curve, I-R Curve.
By using graph, it can check the characteristics of current vs voltage and current vs resistance between each terminals by 4point probe test method. And based on these IV, IR test results, the system can check Ohmic Contact Quality of sample and electrically basic characteristics.
Various Test Results.
Various data can be calculated automatically at once – Bulk & Sheet Carrier Concentration, Mobility, Resistivity, Conductivity, Hall Coefficient, Magnetoresistance, Alpha(Vertical/Horizontal ratio of resistance) and etc.
Sample Structure 3D of Measurement Sample
S/W Operation Evironment Windows 98 / ME / 2000 / NT / XP / VISTA
– Bulk, Sheet Carrier Concentration
– Mobility, Hall Coefficient
– Alpha (Vertical/Horizontal ration of resistance)
* Size : mainbody 360×300×105 mm (W×H×D)/magnet set 200×120×110 mm (W×H×D)
– Weight : 7.7 kg
Materials for Measurement
Si, SiGe, SiC, GaAs, InGaAs, InP, GaN, TCO(including ITO), AlZnO, FeCdTe, ZnO,
etc., all of semiconductors can be measured (N/P-type)
- Acquired CE Mark : Model# HMS2000 – July 1st 2004
Model#HMS300 – March 16th, 2005year.
- Performance Comparison with other companies.
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