Materiale per SEM e TEM

Consumabili ed accessori per microscopia elettronica.

Ecco tutte le sezioni scaricabili del catalogo TAAB:

  1. Grids and Support Films
  2. EM Filaments & Apertures
  3. EM Calibration
  4. Filtration
  5. Specimen Preparation
  6. Tweezer
  7. Vacuum Coaters
  8. Evaporation Supplies, Oils & Greases
  9. Material Science
  10. SEM, TEM, STM Supplies
  11. Optical Microscopy
  12. Microtomy and Histology
  13. Water Chillers
  14. Ultrasonic and Cleaning Supplies
  15. Magnifiers and Stereoscopes
  16. Storage and Disposable Ware
  17. Photographic Supplies
  18. Safety and Protection
  19. Chemicals
  20. Chemical Listing
  21. Index
Tutto 12 /ALD 0 /Alta temperatura e Atmosfera controllata 0 /Analitici 0 /Assottigliatori Ionici 0 /Attivazione superficiale e Plasma Cleaning 0 /BLACK MAGIC per deposizione grafene e CNT 0 /Caratterizzazione ottica 1 /Catodoluminescenza 0 /Catodoluminescenza/EBIC 0 /Critical Point Driers 0 /Cross Section Prep. Kit 0 /Cryo Plunge 0 /CVD 0 /Dimple Grinder 0 /Disc Grinder 0 /Ellissometri laser 0 /Ellissometri spettroscopici 1 /Etching e Coating Systems 2 /Evaporatori e Sputter Coaters 0 /Forni & Stufe 0 /GIF Hardware e Software 0 /Glove box, Isolatori e Flow Box 2 /In Aria 2 /In Vuoto 0 /Measure Samples 2 /Microdispensing e inkjet printing 0 /Micromanipolatori 0 /Microscopi a Forza Atomica 1 /Misura 4 punte 0 /Misura effetto Hall a T ambiente 0 /MOCVD 0 /Multispecimen 0 /NanoIR 0 /NanoTA 0 /Nanotech 1 /News 4 /PECVD – ICPECVD 0 /Per SEM 0 /Per TEM 0 /Plasma Cleaners 0 /Portacampioni 0 /Process Samples 0 /Raffreddanti e Cryo-Transfer 0 /Riflettometri 0 /Riflettometri e Ellissometri 0 /Riscaldanti 0 /Sample Preparation 0 /SEM 0 /Serial Block Imaging 0 /Simulatori Solari - IQE/EQE 0 /Sistemi CVD e ALD 0 /Sistemi nanoIR e nanoTA 0 /Sistemi per etching reattivo 1 /Sistemi PVD 0 /Spettrometri 0 /Stages Dedicati 0 /SThM 0 /Straining Holders 0 /Telecamere 0 /TEM 0 /Tomografici 0 /Ultrasonic Cutter 0 /Vacuum Transfer 0

G [BOX]

24 Febbraio, 2016/da Demo

G [SAFE]

24 Febbraio, 2016/da Demo

PECS II System

Broad argon ion beam system designed to polish and coat samples for SEM imaging and analytical techniques
26 Febbraio, 2016/da Demo

Ilion II System

Ideal for low energy surface preparation for your SEM cross section viewing
26 Febbraio, 2016/da Demo

QScan AFM

7 Marzo, 2016/da Demo

Monocromatori

Bentham has been designing and manufacturing monochromators for over thirty years and has built up a comprehensive range of monochromators to suit almost every light measurement application.
9 Marzo, 2016/da Demo

Dutch universities opt for SENTECH service and flexibility

22 Aprile, 2016/da Francesca Fedele

SENresearch 4.0: Spectroscopic ellipsometry in widest spectral range

The new SENresearch 4.0 is designed for spectroscopic ellipsometry in the widest spectral range from 190 nm (deep UV) to 3,500 nm (NIR)
22 Aprile, 2016/da Demo

AIX G5+ C qualified for manufacturing of high-voltage GaN-on-Si materials in joint project with imec

22 Aprile, 2016/da Demo

Graphenea increases capacity with AIXTRON BM Pro

22 Aprile, 2016/da Demo

RIE plasma etcher SI 591 compact

With the SI 591 compact, a variety of chlorine and fluorine based plasma etching processes can be performed reproducibly with a vacuum load lock and fully computer controlled processing. The SI 591 compact is characterized by a small footprint and flexible design for RIE plasma etching, e.g. the SI 591 compact can be integrated into a cluster system.
22 Aprile, 2016/da Demo

GCI to launch offer for AIXTRON SE

13 Giugno, 2016/da Demo