With top side illumination
- Expands nanoscale IR to a broad range of real world samples
- New resonance enhanced mode enables nanoscale IR on <20nm films
- Rich, interpretable IR spectra
- Powerful, full featured AFM
- Multifunctional measurements including integrated thermal and mechanical property mapping
- Designed and built for productivity and rapid time-to-results
SENTECH – Spectroscopic ellipsometer family SENresearch nanoIR2-s
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