This is the second generation from our nanoscale thermal analysis (nano-TA) family and it adds a powerful DSP controller to this technique which enables sub-100nm local thermal analysis for most commercially available AFMs. This resolution is 100x better than previously reported and is made possible by our thermal probe technology which enables you to:
Image the sample of interest with sub-30nm spatial resolution (in contact or intermittent contact modes) and identify the regions whose thermal properties that you’d like to study.
Heat a local area of less than 100nm diameter with the probe to temperatures of over 400˚C to study thermal properties such as glass transition or melting point.
Local heating allows very fast heating rates up to 600,000˚ C/min and eliminates thermal drift issues that plague bulk sample heating approaches.
Image with a heated tip to induce local thermal events over specific regions of a surface.
Map the temperatures across the sample with a resolution of <0.1 ºC
“I use the nano-TA technique routinely and have found it to be very useful in applications where interfacial properties are difficult to access, such as for weathering, thin films or multilayer systems where DSC can only provide average thermal properties and cannot differentiate the surface or particulate from the matrix.”
Dr. L.T. GerminarioEastman Chemical
“I want you to know that we love the nanoTA. What a powerful technique this is! and so widely applicable to our materials. We have already gained some very good insights on two manufacturing issues. We should have gotten this two years ago!!”
Hyacinth Lechuga3M Corporation
“nano-TA is the first technique to enable bulk thermal analysis users to make local thermal property measurements with ease of use through push button control.”