Transmission electron microscope (TEM) multiple specimen holders provide increased productivity for applications that require comparable screening of multiple specimens.
- Operates at ambient temperature or cryo-temperature, depending on holder model
- Interchangeable cartridge design facilitates handling and storage of fragile specimens
- Opening on one side of FIBBEM™ cartridges allows access of the ion beam and reactive gasses to interact with the samples; cartridge can then be attached to the holder for viewing in the TEM
|677.FIB||α Tilt||FIBBEM cartridge||Yes1||Ambient|
|910||α Tilt||Splitring®mechanism||Yes3||Less than
2 Small pole piece gap configuration does not have a removable cartridge.
3 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI, JEOL and Topcon TEMs.