Multiple Specimen Holders

Accommodate multiple specimens for increased productivity

Transmission electron microscope (TEM) multiple specimen holders provide increased productivity for applications that require comparable screening of multiple specimens.

  • Operates at ambient temperature or cryo-temperature, depending on holder model
  • Interchangeable cartridge design facilitates handling and storage of fragile specimens
  • Opening on one side of FIBBEM™ cartridges allows access of the ion beam and reactive gasses to interact with the samples; cartridge can then be attached to the holder for viewing in the TEM
Model number Specimen
positioning		 Specimen
securing		 Interchangeable cartridge Operating
temperature
677 α Tilt Hexring®
mechanism		 Yes1,2 Ambient
677.FIB α Tilt FIBBEM cartridge Yes1 Ambient
910 α Tilt Splitring®mechanism Yes3 Less than
-170 °C
1 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI and Topcon TEMs. Five specimen positions are available in holders for the JEOL TEMs.
2 Small pole piece gap configuration does not have a removable cartridge.
3 Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI, JEOL and Topcon TEMs.