Optimized for EDS analysis at ambient temperature.
TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
- A beryllium specimen cradle minimizes unwanted x-ray signals
- Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
- To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
- Electrical connections are available for the non-rotating versions of the holder
|Model number||Beryllium cradle||Specimen positioning||Specimen securing||Motorized control||Faraday cup||Maximum electrical feedthroughs (optional)|
|646||Standard||α, β Tilt||Hexring mechanism||β Tilt||Standard||4 – 61|
|650||Standard||α Tilt and rotation||Hexring mechanism||Rotation||No||0|
|925||Standard||α, β Tilt and rotation1||Hexring mechanism||No||0|