Analytical Holders
Optimized for EDS analysis at ambient temperature.
ADVANTAGES
TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
- A beryllium specimen cradle minimizes unwanted x-ray signals
- Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
- To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
- Electrical connections are available for the non-rotating versions of the holder
| Model number | Beryllium cradle | Specimen positioning | Specimen securing | Motorized control | Faraday cup | Maximum electrical feedthroughs (optional) |
|---|---|---|---|---|---|---|
| 643 | Standard | α tilt | Hexring®mechanism | Standard | 6 | |
| 646 | Standard | α, β Tilt | Hexring mechanism | β Tilt | Standard | 4 – 61 |
| 650 | Standard | α Tilt and rotation | Hexring mechanism | Rotation | No | 0 |
| 925 | Standard | α, β Tilt and rotation1 | Hexring mechanism | No | 0 |
