Optimized for EDS analysis at ambient temperature.
TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.
- A beryllium specimen cradle minimizes unwanted x-ray signals
- Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
- To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
- Electrical connections are available for the non-rotating versions of the holder
|Maximum electrical feedthroughs (optional)
|α, β Tilt
|4 – 61
|α Tilt and rotation
|α, β Tilt and rotation1