Analytical Holders

Optimized for EDS analysis at ambient temperature.


TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.

  • A beryllium specimen cradle minimizes unwanted x-ray signals
  • Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
  • To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
  • Electrical connections are available for the non-rotating versions of the holder
Model number Beryllium cradle Specimen positioning Specimen securing Motorized control Faraday cup Maximum electrical feedthroughs (optional)
643 Standard α tilt Hexring®mechanism Standard 6
646 Standard α, β Tilt Hexring mechanism β Tilt Standard 4 – 61
650 Standard α Tilt and rotation Hexring mechanism Rotation No 0
925 Standard α, β Tilt and rotation1 Hexring mechanism No 0
1 2 – 6 for JEOL UHR, 2 – 4 for all other EMMs