The 3View® system allows high throughput, high resolution imaging of a wide variety of samples in 3D. 32k x 24k image support and high performance stages allow fully automated high speed imaging of many different types of samples.
Serial block-face imaging minimizes errors and distortions found when using focus ion beam imaging or traditional serial section imaging
Large format image support (32k x 24k) allows very large images to be collected and minimizes the amount of time wasted waiting for stage motion when imaging very large regions
<50 nm X, Y stage repeatability allows multi-region imaging without losing data due to imprecise stage motion
15 nm Z section thickness without the need to unblur multi-kV images
High performance back-scatter detector allows high speed imaging at low kV without giving up image quality