In-Situ Stages
In-situ heating and tensile testing stages allow dynamic microstructural observations and can provide new insights into materials research.
- Modules are specially engineered for the scanning electron microscope (SEM) environment
- Custom designs allow quick fitting and removal from SEM stages so normal SEM use can be resumed quickly
- Designed to be compatible with geometrical requirements of different detectors including electron backscatter diffraction (EBSD) for dynamic observations
Heating stage modules
- Murano stage available for heating to 950 °C for EBSD applications and 1250 °C for secondary electron detector (SED) imaging
- Study real-time crystallization and phase transformations at elevated temperatures up to 950 °C
- Proprietary design enables offline specimen mounting and storage
- Bulk specimen support designed specifically to operate within EBSD/focused ion beam (FIB)/SED geometry constraints
- Water cooling and heat protective shielding ensure maximum protection at elevated temperatures
- Additional bias control to assist with imaging at elevated temperatures
Microtest tensile stages
- Observe cause of the deformation with the ability to image where change is occurring
- Tensile, compression and bending tests available
- Options for different load cells with load ranges from 2 N up to 5000 N for greater resolution
- Easy to use software interface provides live graphing of quantitative data together with flexible thresholding for more complex experiments, including cyclical loading
- Unique MTVideo option allows synchronized image and data acquisition providing detailed post experiment analysis of the sample deformation and corresponding captured SED images
- Option for complete replacement X,Y, and Z SEM door and stage provides greater flexibility for heavier stages
Model # | Maximum tensile load | Heating option | Cooling option | EBSD option | 3 or 4 Point bending option | Changeable load cell |
Mtest200 | 200 N | √ | √ | √ | √ | √ |
Mtest300 | 300 N | √ | √ | |||
Mtest2000 | 2000 N | √ | √ | √ | ||
Mtest2000E | 2000 N | √ | √ | √ | ||
Mtest5000 | 5000 N | √ | √ | √ | √ | √ |