Quantitatively characterize electrical properties of materials and devices including: in-situIV tracing, identify p-n junction position and measure depletion region widths, determine minority carrier diffusion lengths and defect recombination strengths
Designed for low noise DC measurement allowing picoamp accuracy current measurements
Complete system from sample holder and specimen contacting to acquisition and analysis software
Simple yet powerful software for experiment control and data analysis including auto set up routines
